Patent · US Active

Surface feature manager

US9274064B2 · kind B2 · utility

3Cited by

57References

20Claims

0Family size

Assignee

Seagate Technology LLC · US

Inventors

Joachim Walter Ahner · Livermore, US
David M. Tung · Livermore, US

Key dates

Filing date	Feb 28, 2014
Grant date	Mar 1, 2016
Priority date	—
Expiry date	Feb 28, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG01N23/20
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Provided herein is an apparatus, including a mapping means for generating a map of locations of surface features of an article based on photon-detector signals corresponding to photons scattered from the surface features of the article, and a surface feature manager. The surface manager is configured to locate a predetermined surface feature of the surface features of the article based, at least in part, on the map of the surface features locations, irradiate photons of a first power onto the location of the predetermined surface feature to analyze the predetermined surface feature, and irradiate photons of a second power onto the location of the predetermined surface feature to remove the predetermined surface feature.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.