Automated defect diagnosis from machine diagnostic data
US9274874B1 · kind B1 · utility
11Cited by
4References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 30, 2013 |
| Grant date | Mar 1, 2016 |
| Priority date | — |
| Expiry date | Apr 12, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L41/026
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Diagnosis of defect(s) in a system is disclosed. A defect signature-based query is performed against system diagnostic data stored in one or more structured records. It is determined that a defect signature is associated with a system based at least in part on the query. Remediation information generated based at least in part on the defect signature and the system diagnostic data may be output.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.