Sample holder for electron microscopy for low-current, low-noise analysis
US9275825B2 · kind B2 · utility
7Cited by
5References
8Claims
0Family size
Assignee
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Key dates
| Filing date | Dec 28, 2012 |
| Grant date | Mar 1, 2016 |
| Priority date | — |
| Expiry date | Dec 28, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/2802
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A novel specimen holder for insertion in electron microscopes, wherein the novel specimen holder is designed to minimize electrical noise so that signal integrity can be maintained during in situ electron microscopy.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.