Patent · US Active

Microscopy support structures

US9275826B2 · kind B2 · utility

6Cited by
11References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 28, 2014
Grant dateMar 1, 2016
Priority date
Expiry dateOct 28, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/2802
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.