X-ray detection of flaws in containers and/or in their contents
US9278378B2 · kind B2 · utility
1Cited by
7References
21Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 13, 2012 |
| Grant date | Mar 8, 2016 |
| Priority date | — |
| Expiry date | Jun 13, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/419
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Method and system for x-ray detection of flaws in containers or their contents wherein containers are conveyed on a circular path around a central axis upon which an x-ray source is situated below the plane of the base of the containers. The x-ray source emits x-ray radiation obliquely upwards through the containers to a plurality of imaging x-ray detectors. Analysis of the images provided by these x-ray detectors determines the presence of a flaw in a container or its contents and is used to command a rejection mechanism to reject the container in question.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.