Method and system for probabilistic fatigue crack life estimation
US9280620B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 16, 2012 |
| Grant date | Mar 8, 2016 |
| Priority date | — |
| Expiry date | Aug 5, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L22/12
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A probabilistic estimation of fatigue crack life of a component is provided. A plurality of representations of the component is defined from material property scatter data and flaw-size scatter data, wherein each representation is defined by one possible material condition and flaw-size condition associated with the component. For each representation, a component location is selected and a determination is made whether said individual representation fails after a given number of cycles N, based on the calculation of a crack growth in the selected location. The crack growth is calculated on the basis of the material condition and the flaw-size condition in the selected location. Failure of the individual representation is determined if the crack growth is determined to be unstable. The sum total of the number of the representations that failed after N cycles is determined. A probability of failure of the component after N cycles is then determined.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.