Patent · US Active

Systems and methods for stand-off inspection of aircraft structures

US9285296B2 · kind B2 · utility

49Cited by
5References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 2, 2013
Grant dateMar 15, 2016
Priority date
Expiry dateJun 4, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/8867
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system for stand-off inspection comprising local positioning system hardware and a nondestructive evaluation instrument supported by a pan-tilt mechanism. The system further comprises a computer system that is programmed to perform the following operations: (a) directing the local positioning system hardware toward an area of a surface on a target object by control of the pan-tilt mechanism; (b) activating the local positioning system hardware to acquire an image; (c) processing the image to determine whether an anomaly is present in the area; (d) if an anomaly is present, determining coordinates of a position of the anomaly in a coordinate system of the target object; and (e) directing the nondestructive evaluation instrument toward a position corresponding to the coordinates. Optionally, the computer system is further programmed to measure one or more characteristics of the anomaly.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.