Application system and method for measuring and compensating for optical distortion
US9286684B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 12, 2014 |
| Grant date | Mar 15, 2016 |
| Priority date | — |
| Expiry date | May 29, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30244
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Aspects of the present invention relate to systems, methods, and computer program products for measuring and compensating for optical distortion. The system includes a plurality of reference marks; a recording device configured to record a first orientation and a first position of a plurality of reference marks relative to a pointing angle of the recording device when an object is located outside of a field of view of a recording device, the recording device configured to record a second orientation and a second position of a plurality of reference marks relative to the pointing angle of the recording device when an object is located inside the field of view; and a processor configured to compare the first orientation and the first position of the plurality of reference marks to the second orientation and the second position of the plurality of the reference marks for measuring distortion of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.