System and method for correction of geometric distortion of multi-camera flat panel X-ray detectors
US9291726B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 24, 2012 |
| Grant date | Mar 22, 2016 |
| Priority date | — |
| Expiry date | Nov 18, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T7/005
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
System and method for correcting geometric distortion in a multi-camera flat panel X-Ray detector. A scintillator converts X-Ray radiation generated by an X-Ray source into detectable radiation. Internal markers are placed at known locations adjacent to the scintillator, inside a casing of the detector. External markers placed at known locations outside the casing, adjacent to a cover of the detector. At least one imaging sensor acquires, during the calibration phase, a partial image depicting the external markers and the internal markers. The location of the external markers and the internal markers on the partial X-Ray image is found. A parallax free transformation for correcting geometric distortion based on differences between relation between physical location of the external markers and location of the external markers on the X-Ray image and relation between physical location of the internal markers and location of internal markers on the partial X-Ray image is calculated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.