Patent · US Active

Surface planarization method of thin film and preparing method of array substrate

US9293340B2 · kind B2 · utility

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Key dates

Filing dateJun 5, 2013
Grant dateMar 22, 2016
Priority date
Expiry dateJun 5, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02F1/136295
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A surface planarization method of thin film and a preparing method of an array substrate relate to a display field, and can solve the technical problem that the conventional dry etching severely damages the surface flatness of other film layers below the one being etched, thereby improving the display properties of the LCD. The preparing method of the array substrate comprises patterning a non-metallic layer (4) by a dry etching. And following the step of patterning a non-metallic layer (4) by the dry etching, the method further comprises performing surface planarization on a first film layer (3) to recover the first film layer (3) with a rough surface caused by the dry etching to be planar. The first film layer (3) is located below the non-metallic layer (4).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.