Patent · US Active

Composition for tungsten CMP

US9303188B2 · kind B2 · utility

10Cited by
28References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 11, 2014
Grant dateApr 5, 2016
Priority date
Expiry dateApr 5, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/3212
  • WIPO fieldBasic materials chemistry
  • WIPO sectorChemistry

Abstract

A chemical mechanical polishing composition for polishing a substrate having a tungsten layer includes a water based liquid carrier, a colloidal silica abrasive dispersed in the liquid carrier and having a permanent positive charge of at least 6 mV, and a polycationic amine compound in solution in the liquid carrier. A method for chemical mechanical polishing a substrate including a tungsten layer includes contacting the substrate with the above described polishing composition, moving the polishing composition relative to the substrate, and abrading the substrate to remove a portion of the tungsten from the substrate and thereby polish the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.