Information acquiring apparatus and information acquiring method for acquiring information on specimen by using terahertz wave
US9304082B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 12, 2014 |
| Grant date | Apr 5, 2016 |
| Priority date | — |
| Expiry date | Sep 12, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0697
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An information acquiring apparatus that acquires information on a specimen by applying terahertz wave to the specimen through a plate-like member, the specimen being provided between a reflecting member having a reflecting surface and the plate-like member. The apparatus includes an applying unit that applies the terahertz wave to the specimen, a detecting unit that detects the terahertz wave reflected from the specimen, and an information acquiring unit that acquires the information on the specimen by using temporal waveforms acquired from a result of detection performed by the detecting unit, the information acquiring unit using at least a temporal waveform representing a portion of the terahertz wave that is reflected by an interface between the plate-like member and the specimen and a temporal waveform representing a portion of the terahertz wave that is reflected by an interface between the specimen and the reflecting surface of the reflecting member.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.