Patent · US Active

Quenching depth measurement method and quenching depth measurement apparatus

US9304108B2 · kind B2 · utility

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Key dates

Filing dateOct 26, 2011
Grant dateApr 5, 2016
Priority date
Expiry dateNov 12, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N27/72
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A quenching depth measuring method is used for measuring the quenching depth in a workpiece and includes the steps of: magnetizing the workpiece by disposing, in the vicinity of the workpiece, a magnetizer equipped with an exciting coil; detecting, through a detection coil, an induced magnetic field generated by the magnetization; measuring the induced magnetic field as the output voltage of the detection coil; and specifying the thickness of the quenched hardened layer of the workpiece on the basis of known electromagnetic characteristic information of an unquenched material and a fully-quenched material and an output voltage value measured by the detection coil, the unquenched material being made of the same material as the constituent material of the workpiece and being a material on which a quenching process is not performed, the fully-quenched material being a material on which the quenching process is performed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.