Three dimensional stimulated emission depletion microscopy
US9304310B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 14, 2012 |
| Grant date | Apr 5, 2016 |
| Priority date | — |
| Expiry date | Dec 14, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B27/0927
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A STED microscope for producing a 3D image. The microscope has an excitation laser source for providing an excitation laser beam and a depletion laser source for providing stimulated emission depletion laser beam. The excitation beam is capable of exciting fluorescent markers in a sample placed in the sample region and the depletion beam is capable of inducing stimulated emission in the fluorescent marker in the sample in a region around the excitation beam to restrict the size of the region within which the fluorescent markers are excited and wherein the depletion laser source goes through an optical element which creates a cone refractive pattern which induces stimulated emission in the fluorescent marker in the sample. The shape of the light hollow of the cone refractive pattern varies at different distances from the source. This depth profile can be used to distinguish between positions at varying depths within a sample to create a 3D image. The combination of varying intensity across the sample and at different depths means that the present invention is able to produce images with lateral and axial resolutions ranging from the micro to the nano regime.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.