Method for improving linear feature detectability in digital images
US9305344B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 22, 2014 |
| Grant date | Apr 5, 2016 |
| Priority date | — |
| Expiry date | Apr 22, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure is generally directed to of method linear feature detection in a structure by providing a first digital image of the structure, creating a second corresponding digital image of the structure from the first digital image and determining a direction to shift pixels of the second corresponding digital image. A pixel shift value may be input to shift pixels of the second corresponding digital image, and pixels of the second corresponding digital image are shifted by the input pixel shift value in the determined direction. A third corresponding digital image of the structure may be calculated by subtracting the second corresponding digital image of the structure from the first digital image of the structure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.