Patent · US Active

Permeated grooving in CMP polishing pads

US9308620B2 · kind B2 · utility

15Cited by
10References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 18, 2013
Grant dateApr 12, 2016
Priority date
Expiry dateJan 14, 2034

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/24
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A polishing pad for polishing a semiconductor wafer or other materials, having grooves in the polishing pad to enhance the usable lifetime of the polishing pad.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.