Pixel test in a liquid crystal on silicon chip
US9310420B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Jan 24, 2013 |
| Grant date | Apr 12, 2016 |
| Priority date | — |
| Expiry date | Apr 1, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04Q2011/0039
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
An example embodiment includes a continuity testing method of a pixel in a liquid crystal on silicon integrated circuit. The method includes writing a first voltage to a pixel. The pixel is isolated and a wire that is selectively coupled to the pixel is discharged. The method also includes enabling a sensing amplifier configured to sense voltage on the wire. The pixel is electrically coupled to the wire and a resultant voltage on the wire is sensed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.