Methods and apparatus for testing small form factor antenna tuning elements
US9310422B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 1, 2012 |
| Grant date | Apr 12, 2016 |
| Priority date | — |
| Expiry date | Feb 14, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2837
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test system for testing a device under test (DUT) is provided. The test system may include a DUT receiving structure configured to receive the DUT during testing and a DUT retention structure that is configured to press the DUT against the DUT receiving structure so that DUT cannot inadvertently shift around during testing. The DUT retention structure may include a pressure sensor operable to detect an amount of pressure that is applied to the DUT. The DUT retention structure may be raised and lowered vertically using a manually-controlled or a computer-controlled positioner. The positioner may be adjusted using a coarse tuning knob and a fine tuning knob. The positioner may be calibrated such that the DUT retention structure applies a sufficient amount of pressure on the DUT during production testing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.