Method of identifying materials from multi-energy X-rays
US9311277B2 · kind B2 · utility
10Cited by
11References
23Claims
0Family size
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Key dates
| Filing date | Jun 28, 2011 |
| Grant date | Apr 12, 2016 |
| Priority date | — |
| Expiry date | Jan 31, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T7/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A calibration method for a device for identifying materials using X-rays, including: a) determining at least one calibration material and, for each calibration material, at least one calibration thickness of this material, b) measuring, for each of the calibration materials and for each of the selected calibration thicknesses, attenuation or transmission coefficients for X radiation, c) calculating statistical parameters from the coefficients, d) determining or calculating, for each calibration material and for each calibration thickness, a presence probability distribution law, as a function of the statistical parameters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.