Patent · US Active

Method and device for fault detection

US9311477B2 · kind B2 · utility

4Cited by

4References

22Claims

0Family size

Assignees

PROTON WORLD INTERNATIONAL N.V. · BE
STMicroelectronics (Rousset) SAS · FR

Inventors

Fabrice Marinet · Gardanne, FR
Jean-Louis Modave · Ottignies, BE
Gilles Van Assche · Woluwe-Saint-Lambert - Sint-Lambrechts-Woluwe, BE
Ronny Van Keer · Hoeilaart, BE

Key dates

Filing date	Dec 14, 2012
Grant date	Apr 12, 2016
Priority date	—
Expiry date	Oct 11, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG06F2207/7219
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

The disclosure concerns a method implemented by a processing device. The method includes performing a first execution by the processing device of a computing function based on one or more initial parameters stored in a first memory device. The execution of the computing function generates one or more modified values of at least one of the initial parameters, wherein during the first execution the one or more initial parameters are read from the first memory device and the one or more modified values are stored in a second memory device. The method also includes performing a second execution by the processing device of the computing function based on the one or more initial parameters stored in the first memory device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.