Proximity detection apparatus and associated methods having single photon avalanche diodes for determining a quality metric based upon the number of events
US9316735B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 9, 2013 |
| Grant date | Apr 19, 2016 |
| Priority date | — |
| Expiry date | Aug 16, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F77/953
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A proximity detector may include an array of single photon avalanche diodes (SPADs) and an illumination source. Illumination from the illumination source may be reflected by a target to the array of single photon avalanche diodes. The SPADs may be operable to detect events. A number of events detected may be dependent on a level of illumination incident on the SPADs. The proximity detector may then determine a quality metric and calculate an output when the quality metric is at a predetermined level. A related method may include regulating the quality of the data on which such a proximity detector apparatus calculates its output.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.