Automatic implant detection from image artifacts
US9317661B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 17, 2014 |
| Grant date | Apr 19, 2016 |
| Priority date | — |
| Expiry date | Nov 17, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2219/2004
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A computer-implemented method of implant detection includes receiving a three-dimensional (3D) image of an anatomy portion of a patient from computed tomography (CT) projections of the patient in an image processing computing system. A cluster of voxels forming an implant candidate is identified on a CT slice of the 3D image and the identified implant candidate is compared with artifacts of implants from an implant database stored in a memory of the computing system. A best-fit implant is selected from the implant database and a graphical image of the best-fit implant is overlaid on the CT slice on a display of the computing system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.