Method and apparatus for detecting degree of spoilage of food
US9322769B2 · kind B2 · utility
Inventors
Key dates
| Filing date | Jun 19, 2014 |
| Grant date | Apr 26, 2016 |
| Priority date | — |
| Expiry date | Jun 19, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/12
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method detects the degree of spoilage of food by exposing a food sample to an excitation wave having a first wavelength of about 340 nm or about 380 nm, wherein the excitation wave has a bandwidth of 40 nm or less. The excitation wave is permitted to interact with the food sample and return emission spectra. A detector detects the emission spectra. A predetermined threshold value is established which defines when a food sample is or is not spoiled. The emission spectra is analyzed at a second wavelength of about 400 nm, about 450 nm or about 530 nm to provide a test or measured value of the emission spectra indicative of the degree of spoilage of the food sample. Whether or not a food sample is spoiled beyond the predetermined threshold is determined by comparing the measured value to the predetermined threshold value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.