Patent · US Active

Correlated testing system

US9322872B2 · kind B2 · utility

7Cited by
15References
21Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 31, 2011
Grant dateApr 26, 2016
Priority date—
Expiry dateApr 16, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2849
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A computer implemented system for testing electronic equipment where test inputs, test outputs, test applied environmental conditions, and test processes are recorded and correlated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.