Patent · US Active

Predicted fault analysis

US9323234B2 · kind B2 · utility

6Cited by
27References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 24, 2011
Grant dateApr 26, 2016
Priority date
Expiry dateOct 11, 2034

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P90/02
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

Example methods, apparatuses and systems to correlate candidate factors to a predicted fault in a process control system are disclosed. Techniques may include obtaining a value associated with a particular factor corresponding to a process, and predicting a fault based on the value. A set of candidate factors corresponding to the predicted fault may be determined, and a correlation between the predicted fault and at least one factor from the set may be displayed. Different sections of the display may respectively correspond to the predicted fault and to the at least one factor, and the correlation may be indicated by time aligning the different sections. Modifications to one displayed section may result in automatic modification of other sections to maintain the correlation. A user may select one or more candidate factors to be displayed, and may indicate a particular point of a particular section to obtain additional details.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.