Flow based fault testing
US9323597B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 9, 2013 |
| Grant date | Apr 26, 2016 |
| Priority date | — |
| Expiry date | Jan 2, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3672
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Flow based fault testing is provided. A logical constraint model or a state model (LS model) can be generated based on logic/state characteristics of a system under test (SUT). The LS model can be generated from logical constraint grammar statements. The logical constraint grammar can be parsed as part of a pre-test analysis to seek faults related to the logic or states of the model. The inputs and outputs related to the SUT can be employed to determine faults, including post-test analysis for faults. The disclosed subject matter can capture in an automated or semi-automated manner faults that can be missed in more conventional fuzz testing. Further, flow based fault testing can be employed alone, along with, or in combination with conventional fuzz testing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.