Systems and methods for determining parameters for image analysis
US9324155B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 10, 2014 |
| Grant date | Apr 26, 2016 |
| Priority date | — |
| Expiry date | Jul 11, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30101
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods for determining parameters for image analysis are provided. One method includes obtaining ultrasound data of an object, generating an image of the object, and identifying a region of interest in the image. The method also includes determining a plurality of spatially varying parameters for image analysis of the region of interest using prior information for one or more objects of interest, including prior location information for the one or more objects of interest, and wherein the plurality of spatially varying parameters are determined for a plurality of sections of the region of interest and different for at least some of the plurality of sections. The method further includes using the plurality of spatially varying parameters for performing image analysis of the region of interest in the image to determine the location of the one or more objects of interest.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.