Patent · US Active

Method and apparatus for mass analysis utilizing ion charge feedback

US9324547B2 · kind B2 · utility

7Cited by
4References
38Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 18, 2012
Grant dateApr 26, 2016
Priority date
Expiry dateMay 18, 2032

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/425
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method of mass analysis and a mass spectrometer are provided wherein a batch of ions is accumulated in a mass analyzer; the batch of ions accumulated in the mass analyzer is detected using image current detection to provide a detected signal; the number of ions in the batch of ions accumulated in the mass analyzer is controlled using an algorithm based on a previous detected signal obtained using image current detection from a previous batch of ions accumulated in the mass analyzer; wherein one or more parameters of the algorithm are adjusted based on a measurement of ion current or charge obtained using an independent detector located outside of the mass analyzer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.