Method and apparatus for mass analysis utilizing ion charge feedback
US9324547B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 18, 2012 |
| Grant date | Apr 26, 2016 |
| Priority date | — |
| Expiry date | May 18, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/425
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A method of mass analysis and a mass spectrometer are provided wherein a batch of ions is accumulated in a mass analyzer; the batch of ions accumulated in the mass analyzer is detected using image current detection to provide a detected signal; the number of ions in the batch of ions accumulated in the mass analyzer is controlled using an algorithm based on a previous detected signal obtained using image current detection from a previous batch of ions accumulated in the mass analyzer; wherein one or more parameters of the algorithm are adjusted based on a measurement of ion current or charge obtained using an independent detector located outside of the mass analyzer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.