Bandgap with thermal drift correction
US9329614B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 15, 2013 |
| Grant date | May 3, 2016 |
| Priority date | — |
| Expiry date | Apr 23, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L22/34
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In one embodiment a heating mechanism is provided with an integrated circuit for testing and calibration purposes. During production testing, heating elements may be activated in order to quickly bring an integrated circuit up to operating temperature for temperature testing or calibration. Once the operating test temperature has been reached, the circuit can be quickly and easily tested to show it is operable within the design temperature range and/or to obtain calibration data to correct for temperature drift. Calibration data may be used to create correction data, which may be stored within the integrated circuit. During normal operation, the correction data may be used to compensate for variations in operation due to temperature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.