Defect analysis based upon hardware state changes
US9329922B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 12, 2013 |
| Grant date | May 3, 2016 |
| Priority date | — |
| Expiry date | Jun 24, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3055
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Technologies are described herein for performing a defect analysis on a software component based upon collected data that describes the operational state of hardware devices in an execution environment utilized to execute the software component at different points in time. The hardware state data is collected from the hardware devices in the execution environment at different points in time and stored in a version control system. A defect analysis may then be performed for an issue identified in the software component utilizing the hardware state data stored in the version control system. Based upon the results of the defect analysis, one or more actions may be taken such as, but not limited to, rolling the hardware or software configuration of one or more of the hardware devices in the execution environment back to a previous point in time.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.