Polarized millimeter wave imaging system and method
US9330330B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 15, 2014 |
| Grant date | May 3, 2016 |
| Priority date | — |
| Expiry date | Aug 10, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V8/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A detection system includes a polarization analyzer that generates one or more null detection values if an object is sensed in a received millimeter wave (MMW) brightness temperature data set. The polarization analyzer analyzes a polarization parameter in the received MMW brightness temperature data set to generate the one or more null detection values. An object detector detects if the object is present based on a comparison of the one or more null detection values to a predetermined threshold. A singular value decomposition (SVD) unit is enabled by the object detector to decompose the MMW brightness temperature data set into a plurality of image layers. Each image layer includes at least one feature of a scene. An identification unit analyzes the plurality of image layers from the SVD unit to determine a shape or a location of the object from the scene.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.