Simultaneous inorganic mass spectrometer and method of inorganic mass spectrometry
US9330892B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 3, 2014 |
| Grant date | May 3, 2016 |
| Priority date | — |
| Expiry date | Jul 8, 2034 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB01D59/44
- WIPO fieldChemical engineering
- WIPO sectorChemistry
Abstract
An inorganic mass spectrometer capable of measuring a relevant and large or the full mass spectral range simultaneously may include a suitable ion source (e.g., an ICP mass spectrometer with an ICP ion source), an ion transfer region, ion optics to separate ions out of a plasma beam, a Mattauch-Herzog type mass spectrometer with a set of charged particle beam optics to condition the ion beam before an entrance slit, and a solid state multi-channel detector substantially separated from ground potential and separated from the potential of the magnet.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.