Patent · US Active

Simultaneous inorganic mass spectrometer and method of inorganic mass spectrometry

US9330892B2 · kind B2 · utility

1Cited by
11References
21Claims
0Family size

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Key dates

Filing dateJul 3, 2014
Grant dateMay 3, 2016
Priority date
Expiry dateJul 8, 2034

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB01D59/44
  • WIPO fieldChemical engineering
  • WIPO sectorChemistry

Abstract

An inorganic mass spectrometer capable of measuring a relevant and large or the full mass spectral range simultaneously may include a suitable ion source (e.g., an ICP mass spectrometer with an ICP ion source), an ion transfer region, ion optics to separate ions out of a plasma beam, a Mattauch-Herzog type mass spectrometer with a set of charged particle beam optics to condition the ion beam before an entrance slit, and a solid state multi-channel detector substantially separated from ground potential and separated from the potential of the magnet.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.