Pixel structure and fabrication method thereof
US9331106B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 20, 2014 |
| Grant date | May 3, 2016 |
| Priority date | — |
| Expiry date | Mar 20, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D30/6729
Abstract
A fabrication method of a pixel structure includes the following steps. A first metal layer is patterned to form a source electrode and a drain electrode. A semiconductor material layer is patterned to form a channel layer and a pixel pattern. A first insulation layer is formed to cover the channel layer, the source electrode, the drain electrode and the pixel pattern. A gate electrode is formed on the first insulation layer located above the channel layer. A second insulation layer is formed to cover the gate electrode and the first insulation layer. A pixel opening is formed in the first insulation layer and the second insulation layer to expose a partial region of the pixel pattern. The partial region of the pixel pattern exposed by the pixel opening is modified so as to form a pixel electrode electrically connected to the drain electrode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.