Spectral-domain interferometric method and system for characterizing terahertz radiation
US9335213B2 · kind B2 · utility
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8Claims
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Key dates
| Filing date | Aug 1, 2013 |
| Grant date | May 10, 2016 |
| Priority date | — |
| Expiry date | Aug 1, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J11/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system based on spectral domain interferometry for detecting intense THz electric field, allowing the use of thick crystal for spectroscopic purposes, in order to makes long temporal scans for increased spectral resolutions, and overcoming the limitation of over-rotation for presently available high power THz sources. Using this method and system the phase difference of approximately 8898π can be measured, which is 18000 times higher than the phase difference measured by electro-optic sampling (π/2).
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