Patent · US Active

Apparatus and methods for locating source of and analyzing electromagnetic radiation

US9335398B2 · kind B2 · utility

0Cited by

3References

31Claims

0Family size

Assignee

Nanohmics, Inc. · US

Inventors

Byron G. Zollars · Austin, US
Steve M. Savoy · Austin, US
Michael W. Mayo · Austin, US
Daniel R. Mitchell · Austin, US

Key dates

Filing date	Nov 3, 2014
Grant date	May 10, 2016
Priority date	—
Expiry date	Apr 21, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG01J2003/2813
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Method and apparatus for determining direction from which electromagnetic radiation originates and spectral characteristics of the radiation are provided. Lenses, diffraction gratings, which may be present on the surface of the lenses, and mirrors direct radiation to a photodetector. Lens and grating parameters, along with the location, size, relative spacing and orientation of diffracted orders of radiation detected by the photodetector are used for determining direction from which the radiation originates.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.