Patent · US Active

Retrieval of measured values, diagnostic information or device parameters

US9336181B2 · kind B2 · utility

0Cited by
0References
7Claims
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Assignee

Inventor

Key dates

Filing dateJan 8, 2013
Grant dateMay 10, 2016
Priority date
Expiry dateSep 23, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05B2219/32144
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system, a device and a method are for retrieval of measured values, items of diagnostic information or device parameters in level measurement, pressure measurement, flow measurement or limit detection. Provided in the measuring device is a flag which is raised when the measuring device changes a measuring device parameter, for example. An external control device receives this flag and, using said flag, can determine whether a device parameter has been changed in the measuring device. If this is the case, it requests the group of device parameters, associated with this device parameter, from the measuring device. In this manner, the transfer of data can be reduced.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.