Apparatus for materials testing of test objects using X-rays

US9341546B2 · kind B2 · utility

Assignee

• GE Sensing & Inspection Technologies GmbH · DE

Inventors

• Ingo Stuke · Reinfeld, DE
• Til Florian Guenzler · Halver, DE
• Michael Wuestenbecker · Lütjensee, DE
• Jan Kraemer · Lübeck, DE
• Holger Lux · Bargteheide, DE
• Nicolas Bretzke · Kirchbarkau, DE

Key dates

• Filing date: Jan 13, 2009
• Grant date: May 17, 2016
• Expiry date: Jan 14, 2032

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2223/646
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An apparatus for materials testing of test objects using X-rays, the apparatus comprising an X-ray device, comprising: an X-ray source for irradiating a test object held in a test position; an X-ray linear diode array detector comprising at least two detection sections and configured to acquire a complete radial cross-section of the test object; and an electronic control device configured to control the X-ray device, wherein during X-ray testing the test object and the X-ray device are rotatable relative to each other only around an essentially vertical axis of rotation.