Patent · US Active

Method and apparatus for performing pattern alignment to die

US9341962B2 · kind B2 · utility

2Cited by
32References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 28, 2011
Grant dateMay 17, 2016
Priority date
Expiry dateOct 29, 2032

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05K3/4679
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

In a method for patterning a workpiece provided with dies in a direct write machine, pattern data associated with a selected die, or group of dies, is transformed into adjusted circuit pattern data dependent both on the original pattern data and the transformed positions, wherein the adjusted circuit pattern data represents the circuit pattern of the plurality of dies, or group of dies, such that the adjusted circuit pattern is fitted to a plurality of sub-areas of the workpiece area, and wherein each sub-area is associated with a die, or group of dies, among the plurality of dies distributed on the workpiece. A pattern is then written on the workpiece according to the adjusted circuit pattern data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.