Optimal test flow scheduling within automated test equipment for minimized mean time to detect failure
US9342424B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 21, 2013 |
| Grant date | May 17, 2016 |
| Priority date | — |
| Expiry date | May 25, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2894
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention describes a method and system for optimizing a test flow within each ATE (Automated Test Equipment) station. The test flow includes a plurality of test blocks. A test block includes a plurality of individual tests. A computing system schedule the test flow based one or more of: a test failure model, test block duration and a yield model. The failure model determines an order or sequence of the test blocks. There are at least two failure models: independent failure model and dependant failure model. The yield model describes whether a semiconductor chip is defective or not. Upon completing the scheduling, the ATE station conducts tests according to the scheduled test flow. The present invention can also be applied to software testing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.