Handler for testing semiconductor device with detecting sensors
US9343342B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 18, 2015 |
| Grant date | May 17, 2016 |
| Priority date | — |
| Expiry date | Feb 18, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L22/34
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A handler for testing a semiconductor device which is used when testing the fabricated semiconductor device. The handler for testing a semiconductor device includes a stacker to supply and accommodate a customer tray and a position selecting device to move the stacker and select a position of the stacker. By efficiently operating the stacker, the handler is able to continuously handle a large amount of semiconductor devices in a same testing process or continuously handle semiconductor devices in different lots, and equipment is prevented from becoming larger or having more complex designs so that required space, production costs and manpower are reduced and operating rates are improved.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.