Patent · US Active

Communication device, test system and test method thereof

US9347990B2 · kind B2 · utility

0Cited by
3References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 22, 2014
Grant dateMay 24, 2016
Priority date
Expiry dateNov 11, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04M2250/02
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A communication device is provided, which includes: a baseband chip; a target test chip integrated into the baseband chip; an upper-layer processing unit corresponding to the target test chip; and at least one data transport interface and at least one data processing unit corresponding to the at least one data transport interface. The communication device further includes: a first switch, adapted to connect the target test chip with the at least one data transport interface or the upper-layer processing unit; a second switch, adapted to connect the at least one data transport interface with its corresponding data processing unit or the target test chip; and a test control unit, configured to control the first switch and the second switch to connect the data transport interface with the target test chip, so as to enable the communication device to test the target test chip.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.