Magneto optic kerr effect magnetometer for ultra-high anisotropy magnetic measurements
US9348000B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 15, 2013 |
| Grant date | May 24, 2016 |
| Priority date | — |
| Expiry date | Jul 14, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/0325
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A resistive electromagnet assembly comprises a pair of coils with a gap defined between the coils. The resistive electromagnet assembly is configured to generate a field having a magnetic flux density of at least about 4 Tesla and at a sweep rate to complete a hysteresis loop in less than about 1 minute. A support assembly is configured to support a sample of magnetic material within the gap. An optics module is configured to expose a test region of the magnetic material sample to an optical beam probe while the test region is subjected to the field and to receive a reflected beam from the test region. A processor is coupled to the optics module and configured to measure one or more properties of the magnetic material using the received reflected beam.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.