Patent · US Active

Microscope for high spatial resolution imaging a structure of interest in a sample

US9348128B2 · kind B2 · utility

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26Claims
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Key dates

Filing dateMay 3, 2013
Grant dateMay 24, 2016
Priority date
Expiry dateMay 3, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/6463
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A microscope for high spatial resolution imaging a structure of interest in a sample comprising a substance having a first state with first spectral properties and a second state with second spectral properties, the microscope comprising: an objective-lens assembly, a wave front modulating optical device adapted to spatially vary an intensity of a transfer light beam, a probe detector arranged to detect an optical measurement signal from a portion of the substance in the second state and placed in an area of the transfer light beam with an intensity adapted not to transfer the substance between the first and second states said microscope comprising a phase contrast microscopy system which includes an intensity detector arranged to detect an intensity of an illuminating light beam after said illuminating light beam has passed through the sample, the objective-lens assembly and the wave front modulating optical device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.