Extraction of problem diagnostic knowledge from test cases
US9348739B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 10, 2014 |
| Grant date | May 24, 2016 |
| Priority date | — |
| Expiry date | Sep 5, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N5/025
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments of the present invention enable users to extract knowledge from testing scenarios performed during application development, and later employ that knowledge to interpret application usage scenarios to enhance serviceability of applications by expediting identification and solving of problems. In an exemplary embodiment, log data generated during simulation of test cases is analyzed to create one or more rules based on patterns in which one or more log entries appear in the log data. Later, log data may be analyzed to look for a pattern of log entries that matches a pattern-based rule, thereby facilitating faster identification and resolution of the problem.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.