Test pattern membrane and method for testing capacitive sensors
US9350344B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 17, 2014 |
| Grant date | May 24, 2016 |
| Priority date | — |
| Expiry date | Nov 15, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K2217/960705
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A test pattern membrane test method uses a test pattern membrane to test the capacitive sensors of a device. The device is placed in the test fixture. The capacitive sensors are read without the test pattern membrane, storing as a set of baseline measurements. The test pattern membrane is placed on the unit to be tested. The test pattern membrane has a plurality of conductive areas on a non-conductive substrate. The conductive areas are arranged in a pattern that corresponds to the pattern of capacitive sensors. The sensors are read again to obtain a set of stimulated measurements. Differences for each of the sensors are determined between the sensor readings with and without the test pattern membrane in place. This difference is compared to a threshold. A sensor is considered to be functioning properly if the difference value is greater than the sensor's threshold value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.