Patent · US Active

System for calculation of material properties using reflection terahertz radiation and an external reference structure

US9360296B2 · kind B2 · utility

5Cited by
4References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 18, 2013
Grant dateJun 7, 2016
Priority date
Expiry dateOct 18, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/8901
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system for interpreting terahertz radiation includes a terahertz transmitter configured to output a pulse of terahertz radiation and a terahertz receiver configured to receive at least a portion of the pulse of radiation from the terahertz transmitter. The terahertz receiver is configured to output a signal based on the radiation received by the terahertz receiver.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.