Method and apparatus for self-calibration of density profiler
US9360406B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 17, 2013 |
| Grant date | Jun 7, 2016 |
| Priority date | — |
| Expiry date | Oct 27, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N9/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A process and system for self-calibration of a density profiler is disclosed. The process may include measuring a density profile of a fluid in a vessel using a plurality of sensors or a single sensor, and measuring a density profile of the fluid in the vessel using a plurality of sample ports. A density of the fluid proximate a location of at least one of the plurality of sample ports based on the sensor measured density profile may then be interpolated. A density of the fluid proximate a location of at least one of the plurality of sensors based on the sample port measured density profile may also be interpolated. Adjustment of a calibration of at least one of the plurality of sensors may then be made based on both the interpolated sample port density and the interpolated sensor density.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.