Method for processing data derived from an ionizing radiation detector
US9360568B2 · kind B2 · utility
2Cited by
4References
9Claims
0Family size
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Key dates
| Filing date | Oct 5, 2010 |
| Grant date | Jun 7, 2016 |
| Priority date | — |
| Expiry date | Jan 21, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/247
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
Measurements of electric charges obtained by the impact of ionizing radiation on a semiconductor detector are grouped in a histogram. Calibrations and data otherwise obtained are used to obtain acceptance probabilities of measurements, which are used to construct a histogram of events by weighting the measurements so as to exclude the influence of some factors (such as diffused radiation) or on the contrary to enhance this influence.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.