Apparatus and method for inspecting short circuit defects
US9361820B2 · kind B2 · utility
3Cited by
2References
11Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 8, 2012 |
| Grant date | Jun 7, 2016 |
| Priority date | — |
| Expiry date | Dec 22, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2300/0852
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method of inspecting a short circuit defect between first wires extending in a first direction and a second direction intersecting the first direction and second wires extending in the first or second direction, the method including inspecting a short circuit defect between the first and second wires by using a potential difference monitored only in the second wires.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.