Method for multi-stage control and measurement of opaque white
US9365026B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 22, 2014 |
| Grant date | Jun 14, 2016 |
| Priority date | — |
| Expiry date | Aug 22, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/251
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An ink control method is provided for printing machines having a computer. The color areas are scanned on a surface to be printed using a color measuring device. The surface is a printing substrate coated with opaque white, and the color measuring device takes a number of opaque white color measurements. The computer compares the measured opaque white color values to each other or to a reference color value of the opaque white and stores deviations detected in the computer. The color measurement fields are printed onto the printing substrate. The color measurement fields printed onto the opaque white are measured by the color measuring device. The comparison of the measured color values of the color measurement fields under laid with opaque white and the target color values of the original for color control purposes, the computer factors in the influence of the stored detected deviations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.